Search results for "Transmission electron micrograph"
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Elektronenmikroskopische Untersuchung von Transversalschnitten d�nner Schichten auf festen Unterlagen
1969
A method is described which allows to prepare transverse sections of thin films by means of an ion etching technique so that transmission electron micrographs of the film structure can be carried out. A section through a 6-layered optical film with a total thickness of 0.62 μm is shown as an example.